ITC Mobile Conference Guide

Corporate Forum Part 1

 

11:00  Optimal+ :  Room TBD

AMD and Optimal+: Partnering for Transformation and Margin Improvement

 

 

All remaining presentations will be held in Exhibit Hall

 

 

12:00  Defacto Technologies

 Power-aware Design for Test at RTL 

 

12:20  GOEPEL Electronics

Tools for Embedded Dynamic Memory Test, Bit-Error-Rate Test, Real-Time Diagnostics, and More

 

12:40  Marvin Test Solutions 

Leveraging Open Architecture, Modular Test Platforms for ATE 

 

1:00  PDF Solutions

TBD

 

1:20  Advantest

TBD

   

1:40  Astronics Test Systems

 TBD