ITC Mobile Conference Guide
Thursday Technical Sessions, 9:00 a.m.
On this page:
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Session 20: Advances in Probe Technology
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Session 21: RF/High-Speed Testing
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Session 22: System-level Testing
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Session 23: Trusted IPs: Access and Computations
SESSION 20: Advances in Probe Technology
Kannan Sekar, GLOBALFOUNDRIES (Chair)
Mark Loranger, Form Factor (Firing Line)
Room MKB1
20.1 Potential Paradigm Shift for 3-D Fine-Pitch Test (invited)
Yang Liu, IBM
20.2 Automated Testing of Bare Die-to-Die Stacks
Erik Jan Marinissen, IMEC
20.3 How many probes is enough?
Kevin Tiernan, Texas Instruments
SESSION 21: RF/High-Speed Testing
John Carulli, GLOBALFOUNDRIES (Chair)
Gordon Roberts, McGill University (Firing Line)
Room MKB2
21.1 Challenges in High-Volume RF, ATE, Production Test
Lenny Leon, Xcerra
21.2 A Self-Compensating Built-In Self-Test Solution for RF Phased Array Mismatch
Sule Ozev, Arizona State University
21.3 A Comparative Study of One-Shot Statistical Calibration Methods for Analog/RF ICs
Yichuan Lu, University of Texas at Dallas
SESSION 22: System-level Testing
Masahiro Fujita, University of Tokyo (Chair)
Xinli Gu, Huawei Technologies(Firing Line)
Room MKB3
22.1 Hardware In Loop Testing of an Insulin Pump
Presenter: Sriram Karunagaran, Amrita Vishwa Vidyapeetham University
22.2 Using hardware Testing Approaches to Improve Software Testing: Equivalent Mutant Identification (invited)
Presenter: Jianwei Zhang, University of Southern California
22.3 End to End Adaptive Test: From System to Component and Back
Bert Gab, Cisco Systems
SESSION 23: Trusted IPs: Access and Computations
Ramesh Karri, New York University (Chair)
Room MKB4
23.1 FASTrust: Feature Analysis for Third-Party IP Trust Verification
Qiaoyi Liu, Tsinghua University
23.2 Secure Design-for-Debug for Systems-on-Chip
Jerry Backer, Polytechnic School of Engineering, New York University
23.3 Extending Residue-based Fault Tolerance to Encrypted Computation
Nektarios Tsoutsos, New York University School of Engineering