ITC Mobile Conference Guide

Wednesday Technical Sessions, 10:30 a.m.

 

On this page:

• Session 13: Test, Repair and Defect Resilience for IoT

• Session 14: Boundary-Scan to the Rescue

• Session 15: Timing Test

• Embedded Tutorial 1: PDL Programming for IEEE 1149.1 and IEEE 1687

• Panel 2: Cell-aware ATPG: Beyond the Hype

 

 

SESSION 13:  Test, Repair and Defect Resilience for IoT

Harry Chen, Mediatek (Chair)

Cheng-Wen Wu, National Tsing Hua University (Firing Line)

Room MKB2

 

 

13.1  Rapid Prototyping and Test before Silicon of Integrated Pressure Sensors

Adrian Voinea, Infineon Technologies Romania

 

 

13.2  A General Testing Method for Digital Microfluidic Biochips under Physical Constraints

Trung Dinh, Ritsumeikan University

 

 

13.3  ATE Test Challenges for MEMS Devices

Robert Bartlett, Advantest

 

RATE SESSION 13

 

 

SESSION 14:  Boundary-Scan to the Rescue

Adam Ley, ASSET InterTech (Chair)

William Eklow, Cisco Systems (Firing LIne)

Room MKB3

 

14.1 Streamlining Mixed Signal Board Test using JTAG Techniques (invited)

Terry Duepner, National Instruments Corp.

 

14.2  Flexible and extendable System-Level JTAG  Manager (invited)

Michele Portolan,  University of Grenoble Alpes

 

14.3  The Next Dimension of Boundary Scan (invited)

Adam Cron, Synopsys

 

RATE SESSION 14

 

 

SESSION 15:  Timing Test
Anne Gattiker, IBM (Chair)

Peter Wohl, Synopsys (Firing Line)

Room  MKB4

 

15.1 Stochastic Timing Error Rate Estimation under Process and Temporal Variations
Masanori Hashimoto, Osaka University

 

15.2   Transition Test: Beyond the ATPG Box (invited)
Scott Davidson, Oracle Corporation

 

 

RATE SESSION 15

 

 

Embedded Tutorial 1:  PDL Programming for IEEE 1149.1 and IEEE 1687

Room DGB South A & B

 

ET 1 .1 Martin Keim, Mentor Graphics

 

RATE EMBEDDED TUTORIAL 1

 

 

PANEL 2:  Cell-aware ATPG: Beyond the Hype

Robert Aitken, ARM (Moderator) • Erik Jan Marinissen – IMEC and Sandeep Goel – TSMC (Organizers)

Room MKB1

 

2014 was a break-through year for Cell-Aware ATPG, with claims that Cell-Aware ATPG was already a standard feature with several success stories. In 2015, it is time to re-evaluate and look beyond the hype. How effective is Cell-Aware ATPG in detecting real-life defects? Why did it take so long for the ATPG community to come up with this idea? Where/When is Cell-Aware useful? Where/When is it not? These questions and many more will be answered by an esteemed group of panelists. No hype!

 

Panelists  

Jeff Block, DCG Systems

Stefan Eichenberger, NXP Semiconductors

Sandeep Goel, TSMC

Friedrich Hapke, Mentor Graphics

Peter Wohl, Synopsys

 

RATE PANEL 2