ITC Mobile Conference Guide
Poster Session Part 2, 12:00 noon
Rate the Thursday Poster Session
Poster 2.1: eFlash MCUs Multi-Temperature Coverage Maximization and Test Cost Optimization
Davide Appello, ST Micro
Poster 2.2: Open Defect Critical Area As a Function of Fan-Outs
Masayuki Arai, Nihon University
Poster 2.3: Leveraging Different Standards Together for Embedded Testing
Bill Atwell, Silicon Aid
Poster 2.4: Diagnosis in Low-Pin-Count TAM Architectures
Vivek Chickermane, Cadence
Poster 2.5: Device Characterization During Production Test Through Targeted Inline Data Collection
Cameron Cook, Texas Instruments
Poster 2.6: Dynamic Part Average Testing for Automotive IC Final Testing
Wim Dobbelaere, ON Semiconductor
Poster 2.7: A Case Study of Low-Pin-Count Test Controller for Pin-Limited Low Power Designs
Deepak Shetty, Cypress
Poster 2.8: Withdrawn
Poster 2.9: Final Test Solution of WLCSP Devices
Michael Frazier, Xcerra
Poster 2.10: Dynamic Versus Static Linear Encoding
Emil Gizdarski, Synopsys
Poster 2.11: Techniques to Improve Library Cell Defect Characterization
Ruifeng Guo, Synopsys
Poster 2.12: Combined Structural and Functional Test Coverage Concept Through PCOLASOQ-FAM
Buck Hoon Lau, Intel
Poster 2.13: On EDT Bandwidth Management with Dynamic Shift Cores
Yu Huang, Mentor Graphics
Poster 2.14: Adaptive Soak Execution through Thermal Couplers for High-Parallelism Probe Card
Gyuyeol Kim, Samsung
Poster 2.15: ATPG: Maximizing Test Coverage Through Early DFT
Elizabeth Lillis, Analog Devices
Poster 2.16: Optimizing In-Circuit Test Cost Using Machine Learning and Test Sampling
Tony Lin, Cisco Systems
Poster 2.17: Enabling Plug-and-Play Architecture For Testing Chips Hierarchically
Kelly Ockunzzi, GLOBALFOUNDRIES
Poster 2.18: Innovative Methodology for Meeting Industrial Temperature Spec in Post-Silicon-Validation – Thermal Perspective
Ying Feng Pang, Intel
Poster 2.19: Flood-Filling Compression Hardware with Observation Flops
Raghuraman Rajanarayanan, Achronix Semiconductor
Poster 2.20: Concurrent Testing of Logic and Memory, and Detection of Memory Functional Paths in SOCs
Qihang Shi, University of Connecticuit
Poster 2.21: Low-Cost Ultra-Pure Sine Wave Generation with Self Calibration
Yuming Zhuang, Iowa State University