ITC Conference Guide
Wenesday Technical Sessions, 8:30 a.m.
SESSION 6: Room 602-4
More Test Compression: Cadence, Mentor, Synopsys
Xiaowei Li, Chinese Academy of Sciences (Chair)
6.1 Efficient Testing of Hierarchical Core-based SOCs
Presenter: Brion Keller, Cadence Design Systems
Firing Line: Rohit Kapur, Synopsys
6.2 Isometric Test Compression with Low Toggling Activity
Presenter: Jerzy Tyszer, Poznan University of Technology
Firing Line: Samy Makar
6.3 Achieving Extreme Scan Compression for SoC Designs
Presenter: Peter Wohl, Synopsys
Firing Line: Manish Sharma, Mentor Graphics
SESSION 7: Room 608-9
Tackling Timing and Power During Test
Masanori Hashimoto, Osaka University (Chair)
7.1 Mitigating Voltage Droop During Scan with Variable Shift Frequency
Presenter: John Schulze, AMD
Firing Line: Pankaj Pant, Intel
7.2 At-speed Capture Power Reduction Using Layout-aware Granular Clock Gate Enable Controls
Presenter: Srivaths Ravi, Texas Instruments
Firing Line: Xiaoqing Wen, Kyushu Institute of Technology
7.3 Fast BIST of I/O Pin AC Specifications and Inter-Chip Delays
Presenter: Stephen Sunter, Mentor Graphics
Firing Line: Paul Berndt, Cypress Semiconductor
SESSION 8: Room 615
Learn From The Experts: High Volume Manufacturing
Phil Nigh, IBM (Chair)
8.1 Latent Defect Detection in Microcontroller-embedded Flash Test Using Device Stress and Wordline Outlier Screening
Presenter: Andreas Kux, Infineon Technologies
Firing Line: Adit Singh, Auburn University
8.2 Statistical Silicon Results of Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills
Presenter: Masahiro Ishida, Advantest
Firing Line: Bruce Parnas, Xcerra
8.3 (Invited) Challenges of Testing 100M Chips
Presenter: Sajjad Pagarkar, Qualcomm
Firing Line: Jayashree Saxena, Anora
SESSION 9: Room 618
RF Test: Digital ATE, Radios, Radars
Saghir Shaikh, Broadcom (Chair)
9.1 Low-Cost Phase Noise Testing of Complex RF ICs Using Standard Digital ATE
Presenter: Florence Azais LIRMM
Firing Line: Mustapha Slamani, IBM
9.2 (Invited) Market Opportunities and Testing Challenges for Millimeter Wave Radios and Radars
Presenter: Brian Floyd, North Carolina State University
Firing Line: Keith Schaub, Advantest
9.3 A Novel RF Self-Test for a Combo SoC on Digital ATE with Multisite Applications
Presenter: Chun-Hsien Peng, MediaTek
Firing Line: Yiorgos Makris
IEEE TTTC Edward J. McCluskey Doctoral Dissertation Competition: Final Round: Room 606
Michele Portolan, INP Grenoble (Chair)
DDC 1 Error Prediction and Detection Methodologies for Reliable Circuit Operation under NBTI
Julio Vazquez-Hernandez, INAOE
DDC 2 DFST: Design for Secure Testability
Samah Saeed, NYU Polytechnic
DDC 3 Analysis and Test of the Effects of Single-event Upsets Affecting the Configuration Memory of SRAM-based FPGAs
Luca Cassano, University of Pisa
RATE IEEE TTTC Edward J. McCluskey Doctoral Dissertation Competition