ITC Conference Guide
Thursday Technical Sessions, 1:00 p.m.
SESSION 23: Room 608-9
Manuel d'Abreu, SanDisk (Chair)
23.1 A Reusable BIST with Software-assisted Auto Repair Technology for improved Memory and IO Debug, Validation and Test Time
Presenter: Bruce Querbach, Intel
Firing Line: Xinli Gu, Huawei Technologies
23.2 Analytical MRAM Test
Presenter : Raphael Robertazzi, IBM T.J. Watson Research Center
Firing Line: Robert Aitken, ARM
23.3 Read-disturb Fault Detection in STT-MRAM
Presenter: Mehdi Tahoori, Karlsruhe Institute of Technology
Firing Line: Robert Aitken, ARM
SESSION 24: Room 615
Connecting Process Variation, Yield, and Diagnosis
Sandeep Goel, TSMC (Chair)
24.1 Intra-Die Process Variation-aware Anomaly Detection in FPGAs
Presenter: Youngok Pino, University Southern California
Firing Line: Kun Young Chung, Samsung
24.2 Feature Engineering with Canonical Analysis for Effective Statistical Tests Screening Test Escapes
Presenter: Fan Lin, University of California, Santa Barbara
Firing Line: Shawn Blanton, Carnegie Mellon University
24.3 Logic Characterization Vehicle Design for Maximal Information Extraction for Yield Learning
Presenter: Shawn Blanton, Carnegie Mellon University;
Firing Line: James Li, National Taiwan University
SESSION 25: Room 606
Functional Testing: A Fresh Look
Carol Pyron, Freescale Semiconductor
25.1 (Invited) The Case for Analyzing System-level Failures Using Structural Patterns
Presenter: Harry Chen, MediaTek
Firing Line: Teresa McLaurin, ARM
25.2 EAGLE: A Regression Model for Fault Coverage Estimation Using a Simulation-based Metric
Presenter: Shahrzad Mirkhani, University of Texas at Austin
Firing Line: Mehdi Tahoori, Karlsruhe Institute of Technology
25.3 Comparing the Effectiveness of Cache-resident Tests Against Cycle-accurate Deterministic Functional Patterns
Presenter: Sankar Gurumurthy, AMD
Firing Line: Sounil Biswas, NVIDIA
SESSION 26: Room 602-4
Think You Know ATPG? Think Again
Sybille Hellebrand, University of Paderborn (Chair)
26.1 Fault Sharing in a Copy-on-Write-based ATPG System
Presenter: Xiaolei Cai, Synopsys
Firing Line: Srivaths Ravi, Texas Instruments (India)
26.2 Test Pattern Generation in Presence of Unknown Values Based on Restricted Symbolic Logic
Presenter: Dominik Erb, University of Freiburg
Firing Line: Rubin Parekhji, Texas Instruments
26.3 Efficient SAT-based ATPG Techniques for All Multiple Stuck-At Faults
Presenter: Masahiro Fujita, University of Tokyo
Firing Line: Bernd Becker, University of Freiburg