ITC Conference Guide
Tuesday Technical Sessions, 4 p.m.
SESSION 5: Room 608-9
Discussion Session: Has Adaptive Test Lived Up To Its Expectations?
Dan Glotter, Optimal+ (Moderator); Jeff Roehr, Texas Instruments (Organizer)
5.1 (Invited) Concerns over Predictability of Supply and Quality
Carl Bowen, AMD
5.2 (Invited) The Desire-Friction Ratio of Adaptive Test
Stacy Ajouri, Texas Instruments
5.3 (Invited) Collaboration and Teamwork Obstacles
Wesley Smith, Galaxy Semiconductor
5.4 (Invited) ATE and Test Equipment Vendors; Hardware Not Software
Mark Roos, Roos Instruments
PANEL 2: Room 6E
Open Problems in Design, Verification and Test: Why Is It (Not) Business as Usual?
Tim Cheng, UC, Santa Barbara (Moderator); Rubin Parekhji, Texas Instruments (Organizer)
Panelists with wide-ranging technical and business expertise will discuss open problems in design, verification and test. Solutions to these open problems are critical for future electronic systems that will incorporate massive integration of diverse functionality with unprecedented constraints on cost, power/performance, reliability and time-to-market. They will also debate whether existing design-EDA partnerships are adequate or a new ecosystem is required.
Panelists
Sanjive Agarwala, Texas Instruments
Paul Cunningham, Cadence Design Systems
Stephen Pateras, Mentor Graphics
Ruchir Puri, IBM
Ramesh Senthinathan, Broadcom
Srikanth Venkataraman, Intel