ITC Conference Guide

Wenesday Technical Sessions, 10:30 a.m.

 

SESSION 10:  Room 602-4

"Fool" Nyquist, Fix Nonlinearity, Tolerate Jitter

Ken Butler, Texas Instruments (Chair)

 

 10.1  Low-Distortion Signal Generation for ADC Testing

Presenter: Fumitaka Abe, Gunma University

Firing Line: Shreyas Sen, Intel Labs

 

10.2  A Built-in Self-Test Circuit for Jitter Tolerance Measurement in High-   Speed Wireline Receivers

Presenter: Myeong-Jae Park, Seoul National University

Firing Line: Abhijit Chatterjee, Georgia Tech

 

10.3  (Invited) Teaching an Old Dog New Tricks: Views on the Future of Mixed- Signal  IC Design

Presenter: Boris Murmann, Stanford University

Firing Line: Gordon Roberts, McGill University

 

RATE SESSION 10

 

 

SESSION 11:  Room 608-9

Embedded Systems: From Firmware to Large-Scale Applications

Chen-Yong Cher, IBM (Chair)

 

 11.1 (Invited) Top Ten Challenges in Big Data Security and Privacy

Presenter: Praveen Murthy, Fujitsu Laboratories of America

Firing Line: Patrice Godefroid, Microsoft Research 

 

11.2  (Invited) Software in a Hardware View: New Models for HW-dependent Software in SoC Verification and Test

Presenter: Wolfgang Kunz,  University of Kaiserslautern

Firing Line:  Tim Cheng, UC, Santa Barbara

 

11.3  (Invited) Compositional Verification Using Formal Analysis for a Flight-Critical System

Presenter: Guillaume  Brat, NASA Ames Research Center

Firing Line: Masahiro Fujita, University of Tokyo

 

RATE SESSION 11

 

 

SESSION 12:  Room  615

Test Enables Technology Bringup

Enamul Amyeen, Intel (Chair)

 

12.1   (Invited) Design, Technology and Yield in the Post-Moore Era

Presenter: Greg Yeric, ARM

Firing Line:  Wu-Tung Cheng, Mentor Graphics

 

12.2   (Invited) The Importance of DFX: A  Foundry Perspective

Presenter: Saman Adham, TSMC

Firing Line: Ruifeng  Guo, Synopsys  

 

12.3   (Invited) Yield and Performance  Improvement Through Technology-Design Co-optimization in Advanced Technology Nodes

Presenter: Yue  Liang, NVIDIA

Firing Line: Sandeep Gupta,University of Southern California

 

RATE SESSION 12

 

 

 

SESSION 13                                         Room 618

Richard Chrusciel, Vice-President FocusTest (Moderator, Organizer)

 

Discussion Topics:

MEMS Testing Challenges

MEMS Handling and Test Requirements

Solutions for MEMS Testing

 

Participants:

Duane Brown, Advantest

Richard Chrusciel, FocusTest 

Mike Dewey, Marvin Test Systems

Hirokazu Nozawa, TESEC

Rick Poitras, Analog Devices

 

RATE SESSION 13

 

 

ELEVATOR TALKS                                   Room 606

Michail Maniatakos, NYU Abu Dhabi  and  Yanjing Li, Intel (Chair)

 

Elevator talks offer participants very short time slots (with Q&A) to summarize their latest exciting ideas. The name of this session stems from  the idea that it should be possible to deliver the summary within the time span of an elevator ride. In previous years ITC elevator talks featured academic participants. New this year, theelevator talks include an impressive slate of industrial speakers in addition to academic participants. Thesetalks are very short, so don't be late or you might miss some highly exciting ones.

 

Participants:

1. Soumendu Bhattacharyya, Cyberonics

2. Krishnendu Chakrabarty, Duke University

3. Abhijit Chatterjee, Georgia Institute of Technology

4. Jennifer Dworak, Southern Methodist University

5. Stefan Eichenberger, NXP Semiconductors

6. Xin Li, Carnegie Mellon University

7. Debdeep Mukhopadhyay, IIT Kharagpur

8. Nicola Nicolici, McMaster University

9. David O'Brien, Intel

10. David Park, Optimal+

11. Bassillios Petrakis, Cadence

12. T-C. Yang, TSMC

 

RATE THE ELEVATOR TALKS