ITC Conference Guide
Thursday Technical Sessions, 9:00 a.m.
SESSION 19: Room 608-9
Statistical Approaches to AMS Design and Test
Ray Clancy, Broadcom (Chair)
19.1 Bayesian Model Fusion: Enabling Test Cost Reduction of Analog/RF Circuits via Wafer-level Spatial Variation Modeling
Presenter: Shanghang Zhang, Carnegie Mellon University
Firing Line: Yiorgos Makris, University of Texas at Dallas
19.2 IC Laser Trimming Speed-Up Through Wafer-level Spatial Correlation Modeling
Presenter: Constantinos Xanthopoulos,Texas Instruments
Firing Line: Li-C. Wang, UC, Santa Barbara
19.3 (Invited) Design and Test of Analog Circuits Toward Sub-PPM Level
Presenter: Georges Gielen, ON Semiconductor
Firing Line: Abhijit Chatterjee, Georgia Tech
SESSION 20: Room 615
Test and Yield Go 3-DL. Winemberg, Freescale Semiconductor
20.1 Redundancy Architectures for Channel-based 3D DRAM Yield Improvement
Presenter: Bing-Yang Lin, National Tsing Hua University
Firing Line: Yanjing Li, Intel
20.2 Vesuvius-3D: A 3D-DFT Demonstrator
Presenter: Erik Jan Marinissen, IMEC
Firing Line: Erik Larsson, Lund University
20.3 A Distributed, Reconfigurable and Reusable BIST Infrastructure for 3D-Stacked ICs
Presenter: Mukesh Agrawal, Duke University
Firing Line: Erik Larsson, Lund University
SESSION 21: Room 606
Boards and Test: Not Your Dad's Board Test
Zoe Conroy, Cisco Systems (Chair)
21.1 (Invited) Interposer Test: Testing PCBs That Have Shrunk 100X
Presenter: TM Mak, GLOBALFOUNDRIES
Firing Line: William Eklow, Cisco Systems
21.2 Knowledge Discovery and Knowledge Transfer in Board-level Functional Fault Diagnosis
Presenter: Fangming Ye, Duke University
Firing Line: Li-C. Wang, UC, Santa Barbara
21.3 Board Manufacturing Test Correlation to IC Manufacturing Test
Presenter: C. Glenn Shirley,Portland State
Firing Line: Ralf Arnold, Infineon Technologies
SESSION 22: Room 602-4
Validation: Pre-Silicon, Emulation, Post-SiliconT. Chakraborty, Qualcomm (Chair)
Tapan Chakraborty, Qualcomm (Chair)
22.1 On-Chip Constrained Random Stimuli Generation for Post-Silicon Validation Using Compact Masks
Presenter: Xiaobing Shi, McMaster University;
Firing Line: Matteo Sonza Reorda, Politecnico di Torino
22.2 (Invited) Emulation and Its Connection to Test
Presenter: Kenneth Larsen, Mentor Graphics
Firing Line: Nicola Nicolici, McMaster University
22.3 Clustering-based Failure Triage for RTL Regression Debugging
Presenter: Zissis Poulos, University of Toronto
Firing Line: Jacob Abraham, UT-Austin