ITC Mobile Conference Guide
Thursday Technical Sessions, 9:00 a.m.
On this page:
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Session 14: ATE II
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Session 15: Reliability
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Session 16: Test Generation
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Special Session 8: Automotive IC Quality & Reliability: Today's Challenges and Solutions
SESSION 14: ATE II
G. Roberts, McGill University (Chair)
M. Ishida, Advantest (Discussant)
Room 201A
14.1 Power Supply Impedance Emulation to Eliminate Overkills and Underkills due to the Impedance Difference between ATE and Customer Board
Presenter: N. Terao, the University of Tokyo
14.2 I-Q Signal Generation Techniques for Communication IC Testing and ATE Systems
Presenter: H. Kobayashi, Gunma University
14.3 Novel Crosstalk Evaluation Method for High-Density Signal Traces Using Clock Waveform Conversion Technique
Presenter: T. Nakamura, Advantest
SESSION 15: Reliability
L. Winemberg, NXP Semiconductor (Chair)
S-Y. Huang, NTHU-Taiwan (Discussant)
Room 201BC
15.1 BIST-RM: BIST-Assisted Reliability Management of SoCs Using On-Chip Clock Sweeping and Machine Learning
Presenter: M. Sadi, University of Florida
15.2 Efficient Cross-Layer Concurrent Error Detection In Nonlinear Control Systems Using Mapped Predictive Check States
Presenter: S. Banerjee, Georgia Institute of Technology
15.3 Cross-Layer System Reliability Assessment Against Hardware Faults
Presenter: A. Vallero, Politecnico di Torino;
SESSION 16: Test Generation
G. Maston, Synopsys (Chair)
T. Ayres, Synopsys (Discussant)
Room 202CD
16.1 Transformation of Multiple Fault Models to a Unified Model for ATPG Efficiency Enhancement
Presenter: C-H. Wu, National Cheng Kung University
16.2 An Accurate Algorithm for Computing Mutation Coverage in Model Checking
Presenter: H. Chao, State Key Laboratory of Computer Architecture, Institute of Computing Technology
16.3 An On-Chip Self-Test Architecture with Test Patterns Recorded in Scan Chains
Presenter: K-J. Lee, National Cheng Kung University
SPECIAL SESSION 8: Automotive IC Quality & Reliability: Today's Challenges and Solutions
H.-J. Wunderlich, University of Stuttgart (Chair)
Room 202A
S8.1* TBA
Presenter: D. Appello, ST
S8.2* TBA
Presenter: C. Eychenne, Bosch
S8.3* TBA
Presenter: R. Mariani, Intel
S8.4* TBA
Presenter: Y. Zorian, Synopsys
* Invited Talk